2003, Vol.6, No.2, pp.607-618
The main trend of up-to-day electronics is decrease in
the sizes of the active regions of modern integrated
microcircuits and advanced optoelectronic devices. Very small
sizes of doped regions make difficult direct measurements of the
transport processes of dopant atoms and point defects occurring
during device fabrication. This puts in the forefront
importance of simulating these nonlinear processes. To solve the
problem, we construct a scheme of quasichemical reactions for all
species in a crystal lattice, including substitutionally
dissolved dopant atoms, clusters, vacancies and
self-interstitials, "dopant atom - point defect" pairs,
electrons (holes), etc. We also use a formalism of nonequilibrium
thermodynamics to formulate a quantitative model of transport
processes and quasichemical reactions. The set of equations
obtained describe evolution of a multicomponent dopant-defect
system in semiconductor crystals under annealing and other heat
treatments enabling one to predict electrophysical parameters
of doped layers.
Key words:
nonlinear system; coupled diffusion; dopant atom;
point defect
Full text:
Acrobat PDF (202KB)
PostScript (4442KB)
PostScript.gz (329KB)
Copyright © Nonlinear Phenomena in Complex Systems. Last updated: June 27, 2003